| No. |
Part Number |
Image |
Manufacturer |
Description |
Action |
| 101 |
SN74LVC1GX04DBVT |
 |
Texas Instruments |
Crystal Oscillator Driver IC SOT-23-6 |
  |
| 102 |
CD74HC283M |
|
Texas Instruments |
Binary Full Adder with Fast Carry IC 16-SOIC |
|
| 103 |
MC100EP17DTG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-TSSOP |
|
| 104 |
CD74HCT283M |
|
Texas Instruments |
Binary Full Adder with Fast Carry IC 16-SOIC |
|
| 105 |
SN74F283D |
|
Texas Instruments |
Binary Full Adder with Fast Carry IC 16-SOIC |
|
| 106 |
SN74LVT8996PW |
|
Texas Instruments |
Addressable Scan Ports IC 24-TSSOP |
|
| 107 |
MC100EP16FDTG |
|
ON Semiconductor |
Differential Receiver/Driver IC 8-TSSOP |
|
| 108 |
SN74TVC3010PW |
|
Texas Instruments |
Voltage Clamp IC 24-TSSOP |
|
| 109 |
CD74AC283E |
|
Texas Instruments |
Binary Full Adder with Fast Carry IC 16-PDIP |
|
| 110 |
CSSTV32867SGKEREP |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 96-LFBGA (13.5x5.5) |
|
| 111 |
SN74ABT18504PM |
|
Texas Instruments |
Scan Test Device with Universal Bus Transceivers IC 64-LQFP (10x10) |
|
| 112 |
SN74LVT8996IPWREP |
|
Texas Instruments |
Addressable Scan Ports IC 24-TSSOP |
|
| 113 |
74SSTVF32852ZKFR |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) |
|
| 114 |
74SSTUB32868AZRHR |
|
Texas Instruments |
1:2 Configurable Registered Buffer with Parity IC 176-NFBGA (6x15) |
|
| 115 |
SN74SSTU32864GKER |
|
Texas Instruments |
1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) |
|
| 116 |
74SSTUB32865ZJBR |
|
Texas Instruments |
1:2 Registered Buffer with Parity IC 160-NFBGA (9x13) |
|
| 117 |
74SSTUB32865AZJBR |
|
Texas Instruments |
1:2 Registered Buffer with Parity IC 160-NFBGA (9x13) |
|
| 118 |
SN74LS31N |
|
Texas Instruments |
Delay Element IC 16-PDIP |
|
| 119 |
SN74LVTH18652APM |
|
Texas Instruments |
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
|
| 120 |
SN74LVTH182652APM |
|
Texas Instruments |
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
|
| 121 |
SN74LVTH18646APM |
|
Texas Instruments |
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
|
| 122 |
SN74LVT8996PWR |
|
Texas Instruments |
Addressable Scan Ports IC 24-TSSOP |
|
| 123 |
SN74LVT8980AIDWREP |
|
Texas Instruments |
Embedded Test-Bus Controllers IC 24-SOIC |
|
| 124 |
SN74ABT8652DL |
|
Texas Instruments |
Scan Test Device with Bus Transceiver and Registers IC 28-SSOP |
|
| 125 |
SN74ABT18640DL |
|
Texas Instruments |
Scan Test Device with Inverting Bus Transceivers IC 56-SSOP |
|
| 126 |
SN74ABTE16246DLR |
|
Texas Instruments |
Incident-Wave Switching Bus Transceivers IC 48-SSOP |
|
| 127 |
SN74ABT8543DW |
|
Texas Instruments |
Scan Test Device with Registered Bus Transceiver IC 28-SOIC |
|
| 128 |
SN74SSTU32864DZKER |
|
Texas Instruments |
1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) |
|
| 129 |
SN74SSTV32852GKFR |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) |
|
| 130 |
SN74SSTV32852ZKFR |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) |
|
| 131 |
CSSTV32852GKFREP |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) |
|
| 132 |
SN74ABT18245ADGGR |
|
Texas Instruments |
Scan Test Device with Bus Transceivers IC 56-TSSOP |
|
| 133 |
SN74LVTH182502APM |
|
Texas Instruments |
ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) |
|
| 134 |
SN74LVTH18504APM |
|
Texas Instruments |
ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) |
|
| 135 |
SN74SSTUB32864ZKER |
|
Texas Instruments |
1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) |
|
| 136 |
74SSTUB32866AZKER |
|
Texas Instruments |
1:1, 1:2 Configurable Registered Buffer with Parity IC 96-PBGA MICROSTAR (13.6x5.6) |
|
| 137 |
74SSTUB32868ZRHR |
|
Texas Instruments |
1:2 Configurable Registered Buffer with Parity IC 176-NFBGA (6x15) |
|
| 138 |
SN74SSTU32864CZKER |
|
Texas Instruments |
1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) |
|
| 139 |
SN74SSTU32864ZKER |
|
Texas Instruments |
1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) |
|
| 140 |
SN74LVTH18504APMR |
|
Texas Instruments |
ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) |
|
| 141 |
SN74SSTV16859RGQR |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 56-VQFN (8x8) |
|
| 142 |
SN74SSQEB32882ZALR |
|
Texas Instruments |
1:2 Registered Buffer with Parity IC 176-NFBGA (13.5x8) |
|
| 143 |
SN74SSQEC32882ZALR |
|
Texas Instruments |
1:2 Registered Buffer with Parity IC 176-NFBGA (13.5x8) |
|
| 144 |
SN74SSQEA32882ZALR |
|
Texas Instruments |
1:2 Registered Buffer with Parity IC 176-NFBGA (13.5x8) |
|
| 145 |
SN74ABT18245ADLR |
|
Texas Instruments |
Scan Test Device with Bus Transceivers IC 56-SSOP |
|
| 146 |
SN74ABT8646DL |
|
Texas Instruments |
Scan Test Device with Bus Transceiver and Registers IC 28-SSOP |
|
| 147 |
SN74ABT8646DW |
|
Texas Instruments |
Scan Test Device with Bus Transceiver and Registers IC 28-SOIC |
|
| 148 |
SN74SSTEB32866ZWLR |
|
Texas Instruments |
Configurable Buffer with Address-Parity Test IC 96-PBGA (13.6x5.6) |
|
| 149 |
SN74LVTH182504APM |
|
Texas Instruments |
ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) |
|
| 150 |
SN74SSTVF16859GR |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 64-TSSOP |
|
Start With
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